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Скачать с ютуб [Electronics] Automated in-situ TEM sample preparation on a FIB-SEM в хорошем качестве

[Electronics] Automated in-situ TEM sample preparation on a FIB-SEM 2 года назад


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[Electronics] Automated in-situ TEM sample preparation on a FIB-SEM

FIB processes for TEM sample prep from microsample extraction out of bulk sample to lamella thinning were automated using a FIB-SEM. Auto-Microsampling (in-situ lift out) and auto-thinning are operated in series for fully automated TEM sample preparation. Up to 20 lamellas can be prepared at a time. #TEMSamle #InSituLiftOut #AutomatedPreparation #FIBSEM #electronmicroscopy #ElectronMicroscope Available instruments for this measurement are : FIB-SEM system https://www.hitachi-hightech.com/glob... Further details can be found on our membership website with data library. Looking forward to your joining. https://biz.hitachi-hightech.com/sina... About our membership site, see https://www.hitachi-hightech.com/glob...

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