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Atomic Force Microscopy (AFM) for Polymer Characterization and Analysis

www.hookecollege.com • Atomic force microscopy (AFM) is uniquely suited to characterize polymer materials on the nanoscale revealing structures and morphology without the need for extensive sample prep or vacuum environment. Unlike its electron microscopy counterparts, the interaction between probe and sample in AFM is mechanical-based making it especially suited to provide contrast on polymeric type samples. We will review application of AFM to study different polymer materials including thermoplastics, elastomers, blends, and high resolution studies.