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FEI Helios G4 PFIB CXe dual beam FIB/SEM: TEM lamella prep tutorial

In this video tutorial (as always filmed raw, unedited, uncut, and unfiltered), I demonstrate use of our FEI Helios G4 PFIB CXe dual beam FIB/SEM for TEM lamella prep using a Si test specimen. In particular, I emphasize differences between lamella prep with a Ga FIB as compared to a Xe FIB (PFIB). Thanks for watching! Please like, subscribe, and share and let me know if you have any questions or comments. Video topic requests are always welcome and appreciated; I enjoy making these videos and wish I could make them more frequently, but the demands of my job make it tough to do so; I’m in charge of 3 S/TEMs, 2 dual beam FIB/SEM systems, and 1 SEM and this keeps me very busy! Connect with me on LinkedIn:   / nicholas-rudawski-30414528   E-mail me directly: [email protected]