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AFM gallery of local electromagnetic properties images NT-MDT

AFM Studies of local electromagnetic properties. AFM NT-MDT broad frequency range 5 MHz for photodetector and 5 lockin amplifiers; single-pass and double pass techniques. Samples: Carbone nanotubes on Silicon substrate (Topography, stiffness, adhesion, local current); polymer blend of P3HT/PCBM (Topography, lateral force, local current); polymer blend of P3HT/PCBM on ITO substrate (Topography, Phase, amplitude, surface potential) double-pass EFM, single pass KFM; pentacene crystals on Si substrate (Topography,surface potential) Double-pass electric force microscopy; pentacene crystals on Si substrate (Topography,surface potential) Double-pass electric force microscopy; (Topography, Phase, amplitude, surface potential) double-pass EFM, single pass KFM; thermoplastic vulcanizate (iPP, EPDM and carbon black) (Topography, surface potential) double-pass EFM; oligothiophene layers on Si substrate (Topography, Phase) double-pass EFM; self-assemblies of semi-fluorinated alkanes F14H20 on Si substrate ( Topography, surface potential, dielectric response, dC/dZ) Single pass Kelvin Force Microscopy; spoke-weel brush macromolecules of poly(butil-acrylate) Single pass Kelvin Force Microscopy, Amplitude Force Modulation; polymer blend of syndiotactic polystyrene (sPS) and poly(vinyledene fluoride) on Si substrate Single pass Kelvin Force Microscopy;electrospun fibers of P(CDF-TrFE) on Si substrate ( Topography, surface potential) Single pass Kelvin Force Microscopy; immiscible poly( Topography, surface potential) Single pass Kelvin Force Microscopy; blend of polystyrene and poly(vinyl acetate) on ITO substrate