Скачать с ютуб Park NX-Wafer | Low Noise, High Throughput Atomic Force Profiler with automatic defect review в хорошем качестве

Park NX-Wafer | Low Noise, High Throughput Atomic Force Profiler with automatic defect review

Park NX-Wafer is the industry’s leading automated AFM metrology system for semiconductor and related fabrications. It provides wafer fab inspection and analysis, automatic defect review for bare wafers and substrates, and CMP profile measurements. Park NX-Wafer has the highest nanoscale surface resolution with sub-angstrom height accuracy, scan after scan with negligible tip to tip variation and preserved tip sharpness unmatched by others. To watch the full video: http://www.parksystems.com/nx-wafer #NX-Wafer #semiconductor #atomicforcemicroscope